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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 23 — Aug. 10, 1994
  • pp: 5426–5431

Reconstruction of optical-source profiles from fixed-baseline two-pinhole spectral measurements

Ari T. Friberg and David G. Fischer  »View Author Affiliations


Applied Optics, Vol. 33, Issue 23, pp. 5426-5431 (1994)
http://dx.doi.org/10.1364/AO.33.005426


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Abstract

Source masking by a cosine amplitude grating is shown to render possible the reconstruction of the intensity distribution associated with globally incoherent optical sources from spectral measurements performed with a Young’s two-pinhole fixed-baseline interferometer. The effect of the mask is to map the low spatial frequencies of the source intensity onto accessible optical frequencies. The permissible parameter regimes are studied, and the feasibility of the technique is demonstrated by numerical simulations.

© 1994 Optical Society of America

Citation
Ari T. Friberg and David G. Fischer, "Reconstruction of optical-source profiles from fixed-baseline two-pinhole spectral measurements," Appl. Opt. 33, 5426-5431 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-23-5426

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