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Investigation of AGFA-8E56HD photographic emulsion and relief hologram structures by atomic force microscopy

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Abstract

Relief holograms are obtained on Agfa 8E56HD holographic emulsions by a Russian chemical-processing technique that is developed for their PE-2 holographic emulsion. We have shown that the three-dimensional surface profiles can easily be visualized by applying atomic force microscopy to measurement of the relief depth and relief spacing on holographic emulsions. The relief depth and thus diffraction efficiency decreases with increasing exposure time.

© 1996 Optical Society of America

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