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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 10 — Apr. 1, 1998
  • pp: 1814–1819

Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

Pierre-Michel Adam, Pascal Royer, Reda Laddada, and Jean-Louis Bijeon  »View Author Affiliations


Applied Optics, Vol. 37, Issue 10, pp. 1814-1819 (1998)
http://dx.doi.org/10.1364/AO.37.001814


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Abstract

We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light.

© 1998 Optical Society of America

OCIS Codes
(110.1220) Imaging systems : Apertures
(110.2960) Imaging systems : Image analysis
(170.0180) Medical optics and biotechnology : Microscopy
(180.5810) Microscopy : Scanning microscopy
(260.5430) Physical optics : Polarization

History
Original Manuscript: June 5, 1997
Revised Manuscript: September 30, 1997
Published: April 1, 1998

Citation
Pierre-Michel Adam, Pascal Royer, Reda Laddada, and Jean-Louis Bijeon, "Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast," Appl. Opt. 37, 1814-1819 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-10-1814

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