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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 16 — Jun. 1, 1998
  • pp: 3447–3449

Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity

T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi  »View Author Affiliations


Applied Optics, Vol. 37, Issue 16, pp. 3447-3449 (1998)
http://dx.doi.org/10.1364/AO.37.003447


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Abstract

We present a novel optical configuration that yields a fringe pattern that represents the slope changes of a three-dimensional object with a twofold increase in sensitivity. The method offers controllable sensitivity over a wide range. We accomplish it by modifying the in-plane displacement sensitive configuration of speckle interferometry. The detailed theory and the experimental results are presented with a brief discussion on the limiting aspects of the configuration.

© 1998 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(240.6700) Optics at surfaces : Surfaces

History
Original Manuscript: August 20, 1997
Revised Manuscript: January 5, 1998
Published: June 1, 1998

Citation
T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi, "Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity," Appl. Opt. 37, 3447-3449 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-16-3447


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References

  1. Y. Y. Hung, J. L. Turner, M. Tafralian, J. D. Hovanesian, C. E. Taylor, “Optical methods for measuring contour slopes of an object,” Appl. Opt. 17, 128–131 (1978). [CrossRef] [PubMed]
  2. R. S. Sirohi, ed., Speckle Metrology (Marcel Dekker, New York, 1993).
  3. A. R. Ganesan, R. S. Sirohi, “New method of contouring using digital speckle pattern interferometry,” in Optical Testing and Metrology II, C. Grover, ed., Proc. SPIE954, 327–332 (1988). [CrossRef]
  4. P. K. Rastogi, “A two-aperture dual source speckle interferometry for the measurement of the angular variations of a three-dimensional surface,” Opt. Laser Technol. 26, 195–197 (1994). [CrossRef]
  5. P. K. Rastogi, “Slope change contouring of a three-dimensional object using speckle interferometry,” Opt. Commun. 108, 37–41 (1994). [CrossRef]
  6. T. Santhanakrishnan, N. Krishna Mohan, P. Senthilkumaran, R. S. Sirohi, “Slope change contouring for 3D deeply curved objects by multi-aperture speckle shear interferometry,” Optik 104, 27–31 (1996).
  7. R. S. Sirohi, N. Krishna Mohan, “In-plane displacement measurement configuration with two-fold sensitivity,” Appl. Opt. 32, 6387–6390 (1993). [CrossRef] [PubMed]
  8. T. Santhanakrishnan, N. Krishna Mohan, R. S. Sirohi, “Oblique observation speckle shear interferometers for slope change contouring,” J. Mod. Opt. 44, 831–839 (1997). [CrossRef]
  9. A. Sohmer, C. Joenathan, “Two-fold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry,” Opt. Eng. 35, 1943–1948 (1996). [CrossRef]

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