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Applied Optics

Applied Optics


  • Vol. 37, Iss. 16 — Jun. 1, 1998
  • pp: 3447–3449

Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity

T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi  »View Author Affiliations

Applied Optics, Vol. 37, Issue 16, pp. 3447-3449 (1998)

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We present a novel optical configuration that yields a fringe pattern that represents the slope changes of a three-dimensional object with a twofold increase in sensitivity. The method offers controllable sensitivity over a wide range. We accomplish it by modifying the in-plane displacement sensitive configuration of speckle interferometry. The detailed theory and the experimental results are presented with a brief discussion on the limiting aspects of the configuration.

© 1998 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(240.6700) Optics at surfaces : Surfaces

Original Manuscript: August 20, 1997
Revised Manuscript: January 5, 1998
Published: June 1, 1998

T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi, "Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity," Appl. Opt. 37, 3447-3449 (1998)

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