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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 18 — Jun. 20, 1998
  • pp: 3942–3947

Method for obtaining gas concentration with a phase-based metrology system

Craig R. Schwarze, Julie A. Gargas, Julia H. Rentz, and Michael Hercher  »View Author Affiliations


Applied Optics, Vol. 37, Issue 18, pp. 3942-3947 (1998)
http://dx.doi.org/10.1364/AO.37.003942


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Abstract

A new technique is presented for obtaining gas concentration by measuring the slope of the anomalous dispersion at a resonance. We describe the equations that govern this process using a Lorentz model and show that the slope of the anomalous dispersion is directly related to the absorption coefficient. The slope is obtained from an interferometric setup and a frequency modulation spectroscopy technique. Experimental data are presented that illustrate this technique for two different sample cells containing water vapor.

© 1998 Optical Society of America

OCIS Codes
(060.2630) Fiber optics and optical communications : Frequency modulation
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology

History
Original Manuscript: September 19, 1997
Revised Manuscript: February 9, 1998
Published: June 20, 1998

Citation
Craig R. Schwarze, Julie A. Gargas, Julia H. Rentz, and Michael Hercher, "Method for obtaining gas concentration with a phase-based metrology system," Appl. Opt. 37, 3942-3947 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-18-3942

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