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Applied Optics

Applied Optics


  • Vol. 37, Iss. 18 — Jun. 20, 1998
  • pp: 3996–3999

Directional–hemispherical reflectance for Spectralon by integration of its bidirectional reflectance

David A. Haner, Brendan T. McGuckin, Robert T. Menzies, Carol J. Bruegge, and Valerie Duval  »View Author Affiliations

Applied Optics, Vol. 37, Issue 18, pp. 3996-3999 (1998)

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The directional–hemispherical reflectance is obtained for Spectralon, the material chosen for onboard radiometric calibration of the multiangle imaging spectroradiometer, at laser wavelengths of 442, 632.8, and 859.9 nm. With p- and s-polarized incident light and for an angle of incidence of 45°, the bidirectional reflectance distribution function was measured over a polar angle range of 1–85° and a range of azimuthal angles of 0–180° in 10° increments. The resultant directional–hemispherical reflectance is found by integration to be 1.00 ± 0.01 at 442 nm, 0.953 ± 0.01 at 632.8 nm, and 0.956 ± 0.01 at 859.9 nm. The experimental methodology and the data analysis are presented together with a full discussion of the primary experimental errors.

© 1998 Optical Society of America

OCIS Codes
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(140.3460) Lasers and laser optics : Lasers
(160.0160) Materials : Materials

Original Manuscript: September 25, 1997
Revised Manuscript: February 10, 1998
Published: June 20, 1998

David A. Haner, Brendan T. McGuckin, Robert T. Menzies, Carol J. Bruegge, and Valerie Duval, "Directional–hemispherical reflectance for Spectralon by integration of its bidirectional reflectance," Appl. Opt. 37, 3996-3999 (1998)

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