The directional–hemispherical reflectance is obtained for Spectralon, the material chosen for onboard radiometric calibration of the multiangle imaging spectroradiometer, at laser wavelengths of 442, 632.8, and 859.9 nm. With p- and s-polarized incident light and for an angle of incidence of 45°, the bidirectional reflectance distribution function was measured over a polar angle range of 1–85° and a range of azimuthal angles of 0–180° in 10° increments. The resultant directional–hemispherical reflectance is found by integration to be 1.00 ∓ 0.01 at 442 nm, 0.953 ∓ 0.01 at 632.8 nm, and 0.956 ∓ 0.01 at 859.9 nm. The experimental methodology and the data analysis are presented together with a full discussion of the primary experimental errors.
© 1998 Optical Society of America
[Optical Society of America ]
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(140.3460) Lasers and laser optics : Lasers
(160.0160) Materials : Materials
David A. Haner, Brendan T. McGuckin, Robert T. Menzies, Carol J. Bruegge, and Valerie Duval, "Directional–Hemispherical Reflectance for Spectralon by Integration of its Bidirectional Reflectance," Appl. Opt. 37, 3996-3999 (1998)