Directional–Hemispherical Reflectance for Spectralon by Integration of its Bidirectional Reflectance
Applied Optics, Vol. 37, Issue 18, pp. 3996-3999 (1998)
http://dx.doi.org/10.1364/AO.37.003996
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Abstract
The directional–hemispherical reflectance is obtained for Spectralon, the material chosen for onboard radiometric calibration of the multiangle imaging spectroradiometer, at laser wavelengths of 442, 632.8, and 859.9 nm. With p- and s-polarized incident light and for an angle of incidence of 45°, the bidirectional reflectance distribution function was measured over a polar angle range of 1–85° and a range of azimuthal angles of 0–180° in 10° increments. The resultant directional–hemispherical reflectance is found by integration to be 1.00 ∓ 0.01 at 442 nm, 0.953 ∓ 0.01 at 632.8 nm, and 0.956 ∓ 0.01 at 859.9 nm. The experimental methodology and the data analysis are presented together with a full discussion of the primary experimental errors.
© 1998 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(140.3460) Lasers and laser optics : Lasers
(160.0160) Materials : Materials
Citation
David A. Haner, Brendan T. McGuckin, Robert T. Menzies, Carol J. Bruegge, and Valerie Duval, "Directional–Hemispherical Reflectance for Spectralon by Integration of its Bidirectional Reflectance," Appl. Opt. 37, 3996-3999 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-18-3996
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