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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 19 — Jul. 1, 1998
  • pp: 4245–4248

Optical waveguiding in epitaxial PbTiO3 thin films

Elhadj Dogheche, Boujemaa Jaber, and Dénis Rémiens  »View Author Affiliations


Applied Optics, Vol. 37, Issue 19, pp. 4245-4248 (1998)
http://dx.doi.org/10.1364/AO.37.004245


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Abstract

Epitaxial lead titanate (PbTiO3) thin films on SrTiO3 (100) substrate were grown in situ by radio-frequency sputtering for optical waveguiding applications. The crystalline quality of the PbTiO3 films deposited at 550° C has been investigated through x-ray diffraction analysis. It indicates that thin films are completely c-axis oriented (rocking curve FWHM of 0.2° for the 001 reflection). The transmission spectrum method has been used to measure the dispersion of the refractive index. At 632.8 nm, the PbTiO3 film with an (001) orientation exhibits a refractive index of 2.61, which represents 98% of the bulk material. The prism-coupling technique has been also employed to determine the optical attenuation in the planar waveguide. In this study, we report a low propagation loss of 2.2 ± 0.2 dB/cm obtained in a PbTiO3 optical waveguide.

© 1998 Optical Society of America

OCIS Codes
(230.7370) Optical devices : Waveguides
(310.0310) Thin films : Thin films

History
Original Manuscript: October 30, 1997
Revised Manuscript: March 16, 1998
Published: July 1, 1998

Citation
Elhadj Dogheche, Boujemaa Jaber, and Dénis Rémiens, "Optical waveguiding in epitaxial PbTiO3 thin films," Appl. Opt. 37, 4245-4248 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-19-4245


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