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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 19 — Jul. 1, 1998
  • pp: 4268–4269

Generalized Abelès relations for an anisotropic thin film with an arbitrary dielectric tensor: comments

Flavio Horowitz  »View Author Affiliations


Applied Optics, Vol. 37, Issue 19, pp. 4268-4269 (1998)
http://dx.doi.org/10.1364/AO.37.004268


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Abstract

The Cojocaru generalization of the 2 × 2 extended Jones matrix method, placed in a wider context of previous approaches to anisotropic optical thin films, is analyzed from a complementary perspective. This, contrary to initial belief, allows for a simple proof that one may include multiple reflections by taking into account total fields into the anisotropic film, and this therefore provides support for a more widespread use of the method.

© 1998 Optical Society of America

OCIS Codes
(160.1190) Materials : Anisotropic optical materials
(160.4760) Materials : Optical properties
(240.0310) Optics at surfaces : Thin films
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: January 5, 1998
Revised Manuscript: March 5, 1998
Published: July 1, 1998

Citation
Flavio Horowitz, "Generalized Abelès relations for an anisotropic thin film with an arbitrary dielectric tensor: comments," Appl. Opt. 37, 4268-4269 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-19-4268

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