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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 36 — Dec. 20, 1998
  • pp: 8348–8351

Beam Splitter Layer Emission in Fourier-Transform Infrared Interferometers

Jean-Marc Thériault  »View Author Affiliations


Applied Optics, Vol. 37, Issue 36, pp. 8348-8351 (1998)
http://dx.doi.org/10.1364/AO.37.008348


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Abstract

The self-emission from the splitting layer of a Fourier-transform infrared interferometer is modeled with basic properties of optical thin films. The resulting equation gives explicitly the self-emission contribution in terms of the temperature, the complex refractive index, the reflection coefficient, and the thickness of the beam splitter layer.

© 1998 Optical Society of America

OCIS Codes
(010.1290) Atmospheric and oceanic optics : Atmospheric optics
(220.2740) Optical design and fabrication : Geometric optical design
(230.1360) Optical devices : Beam splitters
(260.3160) Physical optics : Interference
(280.1120) Remote sensing and sensors : Air pollution monitoring
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

Citation
Jean-Marc Thériault, "Beam Splitter Layer Emission in Fourier-Transform Infrared Interferometers," Appl. Opt. 37, 8348-8351 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-36-8348

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