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Applied Optics

Applied Optics


  • Vol. 37, Iss. 36 — Dec. 20, 1998
  • pp: 8348–8351

Beam splitter layer emission in Fourier-transform infrared interferometers

Jean-Marc Thériault  »View Author Affiliations

Applied Optics, Vol. 37, Issue 36, pp. 8348-8351 (1998)

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The self-emission from the splitting layer of a Fourier-transform infrared interferometer is modeled with basic properties of optical thin films. The resulting equation gives explicitly the self-emission contribution in terms of the temperature, the complex refractive index, the reflection coefficient, and the thickness of the beam splitter layer.

© 1998 Optical Society of America

OCIS Codes
(010.1290) Atmospheric and oceanic optics : Atmospheric optics
(220.2740) Optical design and fabrication : Geometric optical design
(230.1360) Optical devices : Beam splitters
(260.3160) Physical optics : Interference
(280.1120) Remote sensing and sensors : Air pollution monitoring
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

Original Manuscript: June 5, 1998
Revised Manuscript: September 25, 1998
Published: December 20, 1998

Jean-Marc Thériault, "Beam splitter layer emission in Fourier-transform infrared interferometers," Appl. Opt. 37, 8348-8351 (1998)

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  1. H. E. Revercomb, H. Buijs, H. B. Howell, D. D. Laporte, W. L. Smith, L. A. Sromovsky, “Calibration of IR Fourier transform spectrometers: solution to a problem with the high-resolution interferometer sounder,” Appl. Opt. 27, 3210–3218 (1988).
  2. C. Weddigen, C. E. Blom, M. Höpfner, “Phase corrections for the emission sounder MIPAS-FT,” Appl. Opt. 32, 4586–4589 (1993). [CrossRef] [PubMed]
  3. J.-M. Thériault, C. Bradette, A. Villemaire, M. Chamberland, J. Giroux, “Differential detection with a double-beam interferometer,” in Electro-Optical Technology for Remote Chemical Detection and Identification II, M. Fallahi, E. Howden, eds., Proc. SPIE3082, 65–75 (1997). [CrossRef]
  4. J.-M. Thériault, “Modeling responsivity and self-emission of a double-beam Fourier transform infrared interferometer,” Appl. Opt.37, 0000–0000 (1998), to be published.
  5. O. S. Heavens, Optical Properties of Thin Solid Films (Dover, New York, 1965).

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