OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 37, Iss. 36 — Dec. 20, 1998
  • pp: 8348–8351

Beam splitter layer emission in Fourier-transform infrared interferometers

Jean-Marc Thériault  »View Author Affiliations


Applied Optics, Vol. 37, Issue 36, pp. 8348-8351 (1998)
http://dx.doi.org/10.1364/AO.37.008348


View Full Text Article

Enhanced HTML    Acrobat PDF (155 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The self-emission from the splitting layer of a Fourier-transform infrared interferometer is modeled with basic properties of optical thin films. The resulting equation gives explicitly the self-emission contribution in terms of the temperature, the complex refractive index, the reflection coefficient, and the thickness of the beam splitter layer.

© 1998 Optical Society of America

OCIS Codes
(010.1290) Atmospheric and oceanic optics : Atmospheric optics
(220.2740) Optical design and fabrication : Geometric optical design
(230.1360) Optical devices : Beam splitters
(260.3160) Physical optics : Interference
(280.1120) Remote sensing and sensors : Air pollution monitoring
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

History
Original Manuscript: June 5, 1998
Revised Manuscript: September 25, 1998
Published: December 20, 1998

Citation
Jean-Marc Thériault, "Beam splitter layer emission in Fourier-transform infrared interferometers," Appl. Opt. 37, 8348-8351 (1998)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-37-36-8348


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. H. E. Revercomb, H. Buijs, H. B. Howell, D. D. Laporte, W. L. Smith, L. A. Sromovsky, “Calibration of IR Fourier transform spectrometers: solution to a problem with the high-resolution interferometer sounder,” Appl. Opt. 27, 3210–3218 (1988).
  2. C. Weddigen, C. E. Blom, M. Höpfner, “Phase corrections for the emission sounder MIPAS-FT,” Appl. Opt. 32, 4586–4589 (1993). [CrossRef] [PubMed]
  3. J.-M. Thériault, C. Bradette, A. Villemaire, M. Chamberland, J. Giroux, “Differential detection with a double-beam interferometer,” in Electro-Optical Technology for Remote Chemical Detection and Identification II, M. Fallahi, E. Howden, eds., Proc. SPIE3082, 65–75 (1997). [CrossRef]
  4. J.-M. Thériault, “Modeling responsivity and self-emission of a double-beam Fourier transform infrared interferometer,” Appl. Opt.37, 0000–0000 (1998), to be published.
  5. O. S. Heavens, Optical Properties of Thin Solid Films (Dover, New York, 1965).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited