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Applied Optics

Applied Optics


  • Vol. 38, Iss. 1 — Jan. 1, 1999
  • pp: 152–159

Method for edge detection based on phase jump in a differential interferometer

Weidong Zhou and Lilong Cai  »View Author Affiliations

Applied Optics, Vol. 38, Issue 1, pp. 152-159 (1999)

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We describe a new method for edge detection that uses polarization mixing in a differential heterodyne interferometer. When one of the focused beams of the interferometer scans across an edge, a phase jump of 180° takes place in the very small region of the edge if certain conditions are satisfied. We call this phenomenon phase jump. The conditions in which phase jump can occur are given. The theoretical analysis shows that the slope of a phase jump is infinite and is not affected by step height, the vibration of the sample, or the intensity variation of the light source. Therefore phase jump can be used as the precise index for edge detection. The experimental results show good agreement with the theoretical analysis.

© 1999 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation

Original Manuscript: June 24, 1998
Revised Manuscript: September 22, 1998
Published: January 1, 1999

Weidong Zhou and Lilong Cai, "Method for edge detection based on phase jump in a differential interferometer," Appl. Opt. 38, 152-159 (1999)

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