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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 12 — Apr. 20, 1999
  • pp: 2467–2470

In-Plane rotation analysis by two-wavelength electronic speckle interferometry

Abdel-Karim Nassim, Luc Joannes, and Alain Cornet  »View Author Affiliations


Applied Optics, Vol. 38, Issue 12, pp. 2467-2470 (1999)
http://dx.doi.org/10.1364/AO.38.002467


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Abstract

A simple method is presented for the measurement of in-plane rotation (angle and sign) of an object by use of the conventional in-plane sensitive electronic speckle pattern interferometry technique combined with the two-wavelength laser diode method. The advantage of this method is that it can be used to measure the angle of rotation in a simple way by determination of fringe tilt. The experimental setup is described, and results are presented.

© 1999 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: April 13, 1998
Revised Manuscript: December 1, 1998
Published: April 20, 1999

Citation
Abdel-Karim Nassim, Luc Joannes, and Alain Cornet, "In-Plane rotation analysis by two-wavelength electronic speckle interferometry," Appl. Opt. 38, 2467-2470 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-12-2467


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References

  1. C. Wykes, “Use of electronic speckle pattern interferometry (ESPI) in the measurement of static and dynamic surface displacements,” Opt. Eng. 21, 400–406 (1982). [CrossRef]
  2. J. N. Butters, J. A. Leendertz, “Speckle pattern and holographic techniques in engineering metrology,” Meas. Control 4, 349–354 (1971).
  3. O. J. Lokberg, “Electronic speckle pattern interferometry,” Phys. Technol. 11, 16–22 (1980). [CrossRef]
  4. O. J. Lokberg, G. A. Slettemoen, “Basic electronic speckle pattern interferometry,” in Applied Optics and Optical Engineering, R. Shannon, J. C. Wyant, eds. (Academic, New York, 1987), pp. 455–504.
  5. R. Jones, C. Wykes, Holographic and Speckle Interferometry, 2nd ed. (Cambridge U. Press, Cambridge, 1989). [CrossRef]
  6. Y. Ishii, J. Chen, K. Murata, “Digital phase-measuring interferometry with a tunable laser diode,” Opt. Lett. 12, 233–235 (1987). [CrossRef] [PubMed]

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