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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 12 — Apr. 20, 1999
  • pp: 2467–2470

In-Plane rotation analysis by two-wavelength electronic speckle interferometry

Abdel-Karim Nassim, Luc Joannes, and Alain Cornet  »View Author Affiliations


Applied Optics, Vol. 38, Issue 12, pp. 2467-2470 (1999)
http://dx.doi.org/10.1364/AO.38.002467


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Abstract

A simple method is presented for the measurement of in-plane rotation (angle and sign) of an object by use of the conventional in-plane sensitive electronic speckle pattern interferometry technique combined with the two-wavelength laser diode method. The advantage of this method is that it can be used to measure the angle of rotation in a simple way by determination of fringe tilt. The experimental setup is described, and results are presented.

© 1999 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: April 13, 1998
Revised Manuscript: December 1, 1998
Published: April 20, 1999

Citation
Abdel-Karim Nassim, Luc Joannes, and Alain Cornet, "In-Plane rotation analysis by two-wavelength electronic speckle interferometry," Appl. Opt. 38, 2467-2470 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-12-2467

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