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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 13 — May. 1, 1999
  • pp: 2820–2823

Comparison of temperature resolution of single-band, dual-band, and multiband infrared systems

Krzysztof Chrzanowski, Zbigniew Bielecki, and Marek Szulim  »View Author Affiliations


Applied Optics, Vol. 38, Issue 13, pp. 2820-2823 (1999)
http://dx.doi.org/10.1364/AO.38.002820


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Abstract

A new measure of temperature resolution of IR systems called noise-generated error (NGE) was recently proposed. The NGE does not have limitations of the classical noise-equivalent temperature difference and can be used to describe the resolution of single-band, dual-band, and multiband IR measurement systems. The results of theoretical and experimental testing of the temperature resolution NGE of a developed model of single-band, dual-band, and multiband pyrometers are presented.

© 1999 Optical Society of America

OCIS Codes
(030.5630) Coherence and statistical optics : Radiometry
(040.1880) Detectors : Detection
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(120.6780) Instrumentation, measurement, and metrology : Temperature
(130.3060) Integrated optics : Infrared

History
Original Manuscript: January 19, 1999
Revised Manuscript: January 19, 1999
Published: May 1, 1999

Citation
Krzysztof Chrzanowski, Zbigniew Bielecki, and Marek Szulim, "Comparison of temperature resolution of single-band, dual-band, and multiband infrared systems," Appl. Opt. 38, 2820-2823 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-13-2820

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