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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 16 — Jun. 1, 1999
  • pp: 3468–3473

Measurement of three-dimensional temperature fields with interferometric tomography

Donglou Wu and Anzhi He  »View Author Affiliations


Applied Optics, Vol. 38, Issue 16, pp. 3468-3473 (1999)
http://dx.doi.org/10.1364/AO.38.003468


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Abstract

Optical computerized tomography (OCT) technology is used to reconstruct the asymmetric three-dimensional temperature field generated by radiators and electronic chips. First, the OCT method is described. Second, the reconstructed results are tested by a double-cylinder radiator model. Finally, OCT is applied to reconstruction of the temperature field above the surface of a CPU. The air-temperature field above a CPU circuit can be imaged with an OCT system that reflects whether the heat production from different parts of the CPU is even; therefore possibly the technique can be used to determine whether the integrated-circuit design in the CPU is smart.

© 1999 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(050.2230) Diffraction and gratings : Fabry-Perot
(100.6950) Image processing : Tomographic image processing
(110.6960) Imaging systems : Tomography
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(200.1130) Optics in computing : Algebraic optical processing

History
Original Manuscript: April 24, 1998
Revised Manuscript: December 21, 1998
Published: June 1, 1999

Citation
Donglou Wu and Anzhi He, "Measurement of three-dimensional temperature fields with interferometric tomography," Appl. Opt. 38, 3468-3473 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-16-3468


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