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Applied Optics

Applied Optics


  • Vol. 38, Iss. 19 — Jul. 1, 1999
  • pp: 4004–4010

Characteristics of ray traces at the back of biaxial crystals at normal incidence

E. Cojocaru  »View Author Affiliations

Applied Optics, Vol. 38, Issue 19, pp. 4004-4010 (1999)

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Ray vector traces that can be obtained at the back of a biaxial crystal through crystal rotation are calculated numerically by variation of one of the three Euler angles. Negative and positive lossless biaxial crystals are considered at normal incidence. Interesting features of these traces are evidenced by reference to the circular ring that forms at internal conical refraction.

© 1999 Optical Society of America

OCIS Codes
(080.2730) Geometric optics : Matrix methods in paraxial optics
(120.5710) Instrumentation, measurement, and metrology : Refraction
(190.5330) Nonlinear optics : Photorefractive optics
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence
(260.5430) Physical optics : Polarization

Original Manuscript: July 15, 1998
Revised Manuscript: April 6, 1999
Published: July 1, 1999

E. Cojocaru, "Characteristics of ray traces at the back of biaxial crystals at normal incidence," Appl. Opt. 38, 4004-4010 (1999)

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