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Applied Optics

Applied Optics


  • Vol. 38, Iss. 2 — Jan. 10, 1999
  • pp: 409–415

Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy

Lionel Duvillaret, Frédéric Garet, and Jean-Louis Coutaz  »View Author Affiliations

Applied Optics, Vol. 38, Issue 2, pp. 409-415 (1999)

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Time-domain spectroscopy allows fast and broadband measurement of the optical constants of materials in the terahertz domain. We present a method that improves the determination of the optical constants through simultaneous determination of the sample thickness. This method could be applied to any material with moderate absorption and requires only two measurements of the temporal profile of the terahertz pulses: a reference one without the sample and one transmitted through the sample.

© 1999 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(300.6270) Spectroscopy : Spectroscopy, far infrared

Original Manuscript: July 7, 1998
Revised Manuscript: October 2, 1998
Published: January 10, 1999

Lionel Duvillaret, Frédéric Garet, and Jean-Louis Coutaz, "Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy," Appl. Opt. 38, 409-415 (1999)

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  1. See, for example, the special issue on terahertz electromagnetic pulse generation, physics, and applications, J. Opt. Soc. Am. B 11(12), (1994).
  2. L. Duvillaret, F. Garet, J.-L. Coutaz, “A reliable method for extraction of material parameters in THz time-domain spectroscopy,” IEEE J. Select. Topics Quantum Electron. 2, 739–746 (1996). [CrossRef]
  3. S. Labbé-Lavigne, S. Barret, F. Garet, L. Duvillaret, J.-L. Coutaz, “Far-infrared dielectric constant of porous silicon layers measured by THz time-domain spectroscopy,” J. Appl. Phys. 83, 6007–6010 (1998). [CrossRef]
  4. D. Grischkowsky, S. Keiding, M. van Exter, Ch. Fattinger, “Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors,” J. Opt. Soc. Am. B 7, 2006–2015 (1990). [CrossRef]
  5. M. van Exter, D. Grischkowsky, “Optical and electronic properties of doped silicon from 0.1 to 2 THz,” Appl. Phys. Lett. 56, 1694–1696 (1990). [CrossRef]
  6. J. E. Pedersen, S. R. Keiding, “THz time-domain spectroscopy of nonpolar liquids,” IEEE J. Quantum Electron. 28, 2518–2522 (1992). [CrossRef]
  7. J. F. Whitaker, F. Gao, Y. Liu, “THz-bandwidth pulses for coherent time-domain spectroscopy,” in Nonlinear Optics for High-Speed Electronics and Optical Frequency Conversion, N. Peyghambarian, R. C. Eckhardt, D. D. Lowenthal, eds., SPIE2145, 168–177 (1994).
  8. P. U. Jepsen, S. R. Keiding, “Radiation patterns from lens-coupled THz antennas,” Opt. Lett. 20, 807–809 (1995). [CrossRef] [PubMed]
  9. We showed in Ref. 2 that the Fabry–Perot effect can be treated as a perturbation for the extraction of the complex refractive index of the sample in all practical cases.

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