Self-Interference Patterns and Their Application to Inertial-Fusion Target Characterization
Applied Optics, Vol. 38, Issue 25, pp. 5365-5371 (1999)
http://dx.doi.org/10.1364/AO.38.005365
Acrobat PDF (510 KB)
Abstract
The sphericity and wall-thickness uniformity requirements of direct-drive inertial-fusion targets are of the order of less than 1%. These shells display self-interference patterns (SIP’s) when irradiated with a spatially incoherent, narrow-bandwidth light source and viewed with a compound microscope. These patterns are distinct concentric fringes when the target is uniform, whereas faint, distorted, or discontinuous fringes indicate a nonuniform target. We determined the wall thickness to within ∓0.5 μm by counting the number of fringes in the SIP, independent of the outside diameter. Thickness uniformity is verified to an accuracy better than 0.05 μm. The wall thickness of gas-filled targets can be determined to this accuracy without knowledge of the type of gas or its pressure. The SIP fringe technique is used to select polymer shells typically of 800- to 1000-μm diameter and 5- to 12-μm wall thickness. The fringe locations have been modeled by use of ray tracing and agree well with actual measurements of well-characterized shells. Details of the formation of the SIP fringes, a theoretical model, and the method used for quantitative measurement of the shell-wall thickness with the SIP are presented with validation examples.
© 1999 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(180.3170) Microscopy : Interference microscopy
(220.4840) Optical design and fabrication : Testing
(310.6860) Thin films : Thin films, optical properties
(350.2660) Other areas of optics : Fusion
Citation
Mark D. Wittman and R. Stephen Craxton, "Self-Interference Patterns and Their Application to Inertial-Fusion Target Characterization," Appl. Opt. 38, 5365-5371 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-25-5365
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy (OL)
- Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy: a publisher's erratum (OL)
- Interferometry with optical pickups (OL)
- Thickness-Profile Measurement of Transparent Thin-Film Layers by White-Light Scanning Interferometry (AO)
- Edge Location by Use of Optical Phase Variation (AO)
Related Conference Papers
- Metrology for the Space Interferometry Mission
- High Sensitivity Vibration Measurements with Absolute Calibration
- Application of Frequency Combs for Precision Measurement of Refractive Index of Air
- High Flux Atom Lasers, Interferometry and the Shot Noise Limit
- Absolute distance measurement with 0.1 μm accuracy using the MSTAR sensor
« Previous Article | Next Article »
OSA is a member of 