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Applied Optics

Applied Optics


  • Vol. 38, Iss. 25 — Sep. 1, 1999
  • pp: 5438–5446

Instrument line shape of Fourier transform spectrometers: analytic solutions for nonuniformly illuminated off-axis detectors

Jérôme Genest and Pierre Tremblay  »View Author Affiliations

Applied Optics, Vol. 38, Issue 25, pp. 5438-5446 (1999)

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A simple and powerful method for obtaining analytic instrument line shapes (ILS’s) for Fourier transform spectrometers is explained. ILS’s for off-axis circular and rectangular detectors are calculated to illustrate the method. Results match earlier ILS simulations. The contribution of the nonuniformity of light intensity across the detector surface is also taken into account.

© 1999 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry

Original Manuscript: January 20, 1999
Revised Manuscript: May 27, 1999
Published: September 1, 1999

Jérôme Genest and Pierre Tremblay, "Instrument line shape of Fourier transform spectrometers: analytic solutions for nonuniformly illuminated off-axis detectors," Appl. Opt. 38, 5438-5446 (1999)

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