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Applied Optics

Applied Optics


  • Vol. 38, Iss. 28 — Oct. 1, 1999
  • pp: 6034–6035

Dependence of the reflectance of a multilayer reflector on the thickness of the outer layer

Philip Baumeister  »View Author Affiliations

Applied Optics, Vol. 38, Issue 28, pp. 6034-6035 (1999)

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At nonnormal incidence, the radiant reflectance of a highly reflecting multilayer coating strongly depends on the thickness of the outer layer.

© 1999 Optical Society of America

OCIS Codes
(230.4040) Optical devices : Mirrors
(230.4170) Optical devices : Multilayers
(310.0310) Thin films : Thin films

Original Manuscript: March 2, 1999
Revised Manuscript: May 11, 1999
Published: October 1, 1999

Philip Baumeister, "Dependence of the reflectance of a multilayer reflector on the thickness of the outer layer," Appl. Opt. 38, 6034-6035 (1999)

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  1. J. N. Winn, Y. Fink, S. Fan, J. D. Joannopoulos, “Omnidirectional reflection from a one dimensional photonic crystal,” Opt. Lett. 23, 1573–1575 (1998). [CrossRef]
  2. M. Cutler, “Reflection of light from multilayer films,” B.S. thesis (Department of Physics, Massachusetts Institute of Technology, 13May1939).
  3. H. F. Mahlein, “Properties of laser mirrors at nonnormal incidence,” Opt. Acta 20, 687–697 (1973). [CrossRef]
  4. K. D. Laakmann, M. B. Levy, “Hollow lightpipe and lightpipe tip using a low refractive index inner layer,” U.S. patent5,005,944 (9April1991).
  5. G. Koppelmann, “Zur Theorie der Wechselschichten aus schwachabsorbierenden Substanzen und ihre Verwendung als Interferometerespiegel,” Ann. Phys. (Leipzig) 5, 388–404 (1960). [CrossRef]

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