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Applied Optics

Applied Optics


  • Vol. 38, Iss. 5 — Feb. 10, 1999
  • pp: 863–868

Readout characteristics of a near-field optical probe as a data-storage readout device: submicrometer scan height and resolution

Hiroshi Yoshikawa, Toshifumi Ohkubo, Kenji Fukuzawa, Laurence Bouet, and Manabu Yamamoto  »View Author Affiliations

Applied Optics, Vol. 38, Issue 5, pp. 863-868 (1999)

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A photodiode-embedded near-field scanning microscope cantilever (photocantilever) was used to scan in a noncontact, constant-height mode at a range common in hard disk drives to examine its readout capabilities when mounted on a flying-slider head. The intensity ratios of spatial frequencies that compose the obtained near-field image were analyzed by use of the fast Fourier transform. A simplified model was developed as a guiding principle for estimating the readout characteristics of the near-field optical probe in the above-proximity scan-height range.

© 1999 Optical Society of America

OCIS Codes
(110.2960) Imaging systems : Image analysis
(180.5810) Microscopy : Scanning microscopy
(210.4680) Optical data storage : Optical memories
(210.4770) Optical data storage : Optical recording
(230.5170) Optical devices : Photodiodes

Original Manuscript: May 18, 1998
Revised Manuscript: October 15, 1998
Published: February 10, 1999

Hiroshi Yoshikawa, Toshifumi Ohkubo, Kenji Fukuzawa, Laurence Bouet, and Manabu Yamamoto, "Readout characteristics of a near-field optical probe as a data-storage readout device: submicrometer scan height and resolution," Appl. Opt. 38, 863-868 (1999)

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