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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 1 — Jan. 1, 2000
  • pp: 118–123

Interferometer for use in Wave-Front Testing with a Cross Slit

Mina Ray (Shah), Samir Kumar Sarkar, Rabindranath N. Chakraborty, and Amitabha Basuray  »View Author Affiliations


Applied Optics, Vol. 39, Issue 1, pp. 118-123 (2000)
http://dx.doi.org/10.1364/AO.39.000118


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Abstract

A simple and novel interferometric setup for wave-front testing that uses a cross slit is described. In this method, the test beam illuminates a cross slit placed at the front focal plane of a Fourier lens. It selects two orthogonal slices from the test beam, and the interference of these two beams is observed at a slightly defocused plane near the back focal plane. Fringes of different conical forms (circular, elliptical, or hyperbolic) so obtained can be used for testing a coherent wave front in general. The theory, supported by some experimental results, is presented. An application of the method to the study of the nature of asymmetry in the beam profile of a semiconductor diode laser beam is demonstrated.

© 2000 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry

Citation
Mina Ray (Shah), Samir Kumar Sarkar, Rabindranath N. Chakraborty, and Amitabha Basuray, "Interferometer for use in Wave-Front Testing with a Cross Slit," Appl. Opt. 39, 118-123 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-1-118

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