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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 1 — Jan. 1, 2000
  • pp: 129–134

Optical contrast in apertureless microscopy

Joël Azoulay, Anne Débarre, Alain Richard, and Paul Tchénio  »View Author Affiliations


Applied Optics, Vol. 39, Issue 1, pp. 129-134 (2000)
http://dx.doi.org/10.1364/AO.39.000129


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Abstract

We report on optical image contrast for a specific apertureless near-field optical microscope. We demonstrate that the main part of the optical image’s contrast results from the sample’s topography. The coupling mechanism is analyzed, and we show that the microscope can be regarded as an interferometer that sensitively detects near-field components. However, in the basic configuration the reference field of the interferometer is coupled to the topography. Finally, it is demonstrated that, by controlling the phase of the reference field, one can largely decorrelate the optical image from the topography.

© 2000 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.3170) Microscopy : Interference microscopy
(180.5810) Microscopy : Scanning microscopy

History
Original Manuscript: April 8, 1999
Revised Manuscript: July 30, 1999
Published: January 1, 2000

Citation
Joël Azoulay, Anne Débarre, Alain Richard, and Paul Tchénio, "Optical contrast in apertureless microscopy," Appl. Opt. 39, 129-134 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-1-129


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References

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