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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 1 — Jan. 1, 2000
  • pp: 141–148

Simple recurrence matrix relations for multilayer anisotropic thin films

E. Cojocaru  »View Author Affiliations


Applied Optics, Vol. 39, Issue 1, pp. 141-148 (2000)
http://dx.doi.org/10.1364/AO.39.000141


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Abstract

Generalized Abelès relations for one anisotropic thin film [CojocaruE., Appl. Opt. 36, 2825–2829 (1997)] are developed for light propagation from an isotropic medium of incidence (with refractive index n0) within a multilayer anisotropic thin film coated onto an anisotropic substrate. An immersion model is used for which it is assumed that each layer is imaginatively embedded between isotropic gaps of zero thickness and refractive index n0. This model leads to simple expressions for the resultant transmitted and reflected electric field amplitudes at interfaces. They parallel the Abelès recurrence relations for layered isotropic media. These matrix relations include multiple reflections while they deal with total fields. They can be applied directly to complex stacks of isotropic and anisotropic thin films.

© 2000 Optical Society of America

OCIS Codes
(160.1190) Materials : Anisotropic optical materials
(160.3820) Materials : Magneto-optical materials
(160.4760) Materials : Optical properties
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence
(310.0310) Thin films : Thin films

History
Original Manuscript: April 21, 1999
Revised Manuscript: September 28, 1999
Published: January 1, 2000

Citation
E. Cojocaru, "Simple recurrence matrix relations for multilayer anisotropic thin films," Appl. Opt. 39, 141-148 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-1-141


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