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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 10 — Apr. 1, 2000
  • pp: 1500–1504

Sampling period criterion in a scanning-beam technique

Charles André Schrama and Eric Wilhelmus Maria van der Ham  »View Author Affiliations


Applied Optics, Vol. 39, Issue 10, pp. 1500-1504 (2000)
http://dx.doi.org/10.1364/AO.39.001500


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Abstract

The scanning-beam technique for measuring the response of a detector to an irradiance is analyzed. With this method the irradiance responsivity is determined by integration of the spatial responsivity. Since in practice the integration is approximated by a summation over steps with a finite step size, errors are introduced. It is shown both theoretically and experimentally that the error vanishes when the reciprocal step size lies beyond the diffraction limit. Furthermore, comparison shows that experiment and theory are in good agreement.

© 2000 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(050.1940) Diffraction and gratings : Diffraction
(070.2590) Fourier optics and signal processing : ABCD transforms
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5630) Instrumentation, measurement, and metrology : Radiometry

History
Original Manuscript: August 5, 1999
Revised Manuscript: January 3, 2000
Published: April 1, 2000

Citation
Charles André Schrama and Eric Wilhelmus Maria van der Ham, "Sampling period criterion in a scanning-beam technique," Appl. Opt. 39, 1500-1504 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-10-1500

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