Abstract

The scanning near-field optical microscope (SNOM) has been tested experimentally for a wide variety of applications, but, to date, there has been little work done on the numerical or analytical modeling of the optical field as it propagates throughout the SNOM probe. Therefore, the fabrication on the probes relies more on trial and error than on clear design principles. An algorithm has been developed for the study and optimization of the geometry of SNOM probes fabricated by the heat-drawn and the one-step chemically etched methods. The algorithm uses the finite-difference beam propagation method (FD-BPM) to model the field evolution throughout the SNOM structure.

© 2000 Optical Society of America

Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

Peter N. Moar, John D. Love, François Ladouceur, and Laurence W. Cahill
Appl. Opt. 45(25) 6442-6456 (2006)

Chemically etched fiber tips for near-field optical microscopy: a process for smoother tips

Patrick Lambelet, Abdeljalil Sayah, Michael Pfeffer, Claude Philipona, and Fabienne Marquis-Weible
Appl. Opt. 37(31) 7289-7292 (1998)

Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy

Gregor Schürmann, Wilfried Noell, Urs Staufer, Nico F. de Rooij, Rolf Eckert, Jan M. Freyland, and Harry Heinzelmann
Appl. Opt. 40(28) 5040-5045 (2001)

Near-field launching and mapping unidirectional surface plasmon polaritons using an automated dual-tip scanning near-field optical microscope

Najmeh Abbasirad, Angela Barreda, Yi-Ju Chen, Jer-Shing Huang, Isabelle Staude, Frank Setzpfandt, and Thomas Pertsch
Photon. Res. 10(11) 2628-2641 (2022)

Corrugated metal-coated tapered tip for scanning near-field optical microscope

Tomasz J. Antosiewicz and Tomasz Szoplik
Opt. Express 15(17) 10920-10928 (2007)