Image-Based Bidirectional Reflectance Distribution Function Measurement
Applied Optics, Vol. 39, Issue 16, pp. 2592-2600 (2000)
http://dx.doi.org/10.1364/AO.39.002592
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Abstract
We present a new image-based process for measuring a surface’s bidirectional reflectance rapidly, completely, and accurately. Requiring only two cameras, a light source, and a test sample of known shape, our method generates densely spaced samples covering a large domain of illumination and reflection directions. We verified our measurements both by tests of internal consistency and by comparison against measurements made with a gonioreflectometer. The resulting data show accuracy rivaling that of custom-built dedicated instruments.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(110.2960) Imaging systems : Image analysis
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(160.4760) Materials : Optical properties
(290.5820) Scattering : Scattering measurements
(290.5880) Scattering : Scattering, rough surfaces
Citation
Stephen R. Marschner, Stephen H. Westin, Eric P. F. Lafortune, and Kenneth E. Torrance, "Image-Based Bidirectional Reflectance Distribution Function Measurement," Appl. Opt. 39, 2592-2600 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-16-2592
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