We present a new image-based process for measuring a surface’s bidirectional reflectance rapidly, completely, and accurately. Requiring only two cameras, a light source, and a test sample of known shape, our method generates densely spaced samples covering a large domain of illumination and reflection directions. We verified our measurements both by tests of internal consistency and by comparison against measurements made with a gonioreflectometer. The resulting data show accuracy rivaling that of custom-built dedicated instruments.
© 2000 Optical Society of America
(110.2960) Imaging systems : Image analysis
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(160.4760) Materials : Optical properties
(290.5820) Scattering : Scattering measurements
(290.5880) Scattering : Scattering, rough surfaces
Stephen R. Marschner, Stephen H. Westin, Eric P. F. Lafortune, and Kenneth E. Torrance, "Image-Based Bidirectional Reflectance Distribution Function Measurement," Appl. Opt. 39, 2592-2600 (2000)