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Applied Optics

Applied Optics


  • Vol. 39, Iss. 16 — Jun. 1, 2000
  • pp: 2592–2600

Image-based bidirectional reflectance distribution function measurement

Stephen R. Marschner, Stephen H. Westin, Eric P. F. Lafortune, and Kenneth E. Torrance  »View Author Affiliations

Applied Optics, Vol. 39, Issue 16, pp. 2592-2600 (2000)

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We present a new image-based process for measuring a surface’s bidirectional reflectance rapidly, completely, and accurately. Requiring only two cameras, a light source, and a test sample of known shape, our method generates densely spaced samples covering a large domain of illumination and reflection directions. We verified our measurements both by tests of internal consistency and by comparison against measurements made with a gonioreflectometer. The resulting data show accuracy rivaling that of custom-built dedicated instruments.

© 2000 Optical Society of America

OCIS Codes
(110.2960) Imaging systems : Image analysis
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(160.4760) Materials : Optical properties
(290.5820) Scattering : Scattering measurements
(290.5880) Scattering : Scattering, rough surfaces

Original Manuscript: October 7, 1999
Published: June 1, 2000

Stephen R. Marschner, Stephen H. Westin, Eric P. F. Lafortune, and Kenneth E. Torrance, "Image-based bidirectional reflectance distribution function measurement," Appl. Opt. 39, 2592-2600 (2000)

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