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Applied Optics

Applied Optics


  • Vol. 39, Iss. 16 — Jun. 1, 2000
  • pp: 2628–2637

Phase evaluation of speckle patterns during continuous deformation by use of phase-shifting speckle interferometry

Torgny E. Carlsson and An Wei  »View Author Affiliations

Applied Optics, Vol. 39, Issue 16, pp. 2628-2637 (2000)

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A method for measurement of continuous displacements that uses phase-shifting speckle interferometry is presented. The initial random phase of the speckle pattern is evaluated by phase shifting before deformation. The changing phase thereafter is evaluated from only one image at a time by a least-squares algorithm. The technique can be used for measuring transients and other dynamic events, heat expansion as well as other phenomena, for which it is difficult to accomplish phase shifting during deformation. Theory along with computer simulations and experimental results are described.

© 2000 Optical Society of America

OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

Original Manuscript: September 20, 1999
Revised Manuscript: November 22, 1999
Published: June 1, 2000

Torgny E. Carlsson and An Wei, "Phase evaluation of speckle patterns during continuous deformation by use of phase-shifting speckle interferometry," Appl. Opt. 39, 2628-2637 (2000)

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