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Applied Optics

Applied Optics


  • Vol. 39, Iss. 20 — Jul. 10, 2000
  • pp: 3486–3494

Measuring earthquakes from optical satellite images

Nadège Van Puymbroeck, Rémi Michel, Renaud Binet, Jean-Philippe Avouac, and Jean Taboury  »View Author Affiliations

Applied Optics, Vol. 39, Issue 20, pp. 3486-3494 (2000)

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Système pour l’Observation de la Terre images are used to map ground displacements induced by earthquakes. Deformations (offsets) induced by stereoscopic effect and roll, pitch, and yaw of satellite and detector artifacts are estimated and compensated. Images are then resampled in a cartographic projection with a low-bias interpolator. A subpixel correlator in the Fourier domain provides two-dimensional offset maps with independent measurements approximately every 160 m. Biases on offsets are compensated from calibration. High-frequency noise (0.125 m-1) is ∼0.01 pixels. Low-frequency noise (lower than 0.001 m-1) exceeds 0.2 pixels and is partially compensated from modeling. Applied to the Landers earthquake, measurements show the fault with an accuracy of a few tens of meters and yields displacement on the fault with an accuracy of better than 20 cm. Comparison with a model derived from geodetic data shows that offsets bring new insights into the faulting process.

© 2000 Optical Society of America

OCIS Codes
(100.0100) Image processing : Image processing
(100.2000) Image processing : Digital image processing
(100.2960) Image processing : Image analysis
(100.6640) Image processing : Superresolution
(280.0280) Remote sensing and sensors : Remote sensing and sensors

Original Manuscript: December 14, 1999
Revised Manuscript: May 3, 2000
Published: July 10, 2000

Nadège Van Puymbroeck, Rémi Michel, Renaud Binet, Jean-Philippe Avouac, and Jean Taboury, "Measuring earthquakes from optical satellite images," Appl. Opt. 39, 3486-3494 (2000)

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