A fast and efficient technique for profilometric measurement with a color-coded grating is proposed. Eight colors are used to code the grating, and each color represents only one logical state. There are 64 stripes in one period of the color grating, which is large enough for normal measurement. Compared with the previous techniques, it has the advantages of simple hardware without moving mechanical parts, single exposure for obtaining three-dimensional information, little influence from noise and from nonlinearity of the CCD camera on the measurement accuracy, and higher anti-color-blurring capability. The suggested technique is suitable for on-line inspection and dynamic measurement of moving objects.

© 2000 Optical Society of America

[Optical Society of America ]

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

Related Journal Articles

• Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy (OL)
• Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy: a publisher's erratum (OL)
• Speckle-induced phase error in laser-based phase-shifting projected fringe profilometry (JOSAA)
• Digital holography for quantitative phase-contrast imaging (OL)
• Increasing the Range of Unambiguity in Step-Height Measurement with Multiple-Wavelength Interferometry-Application to Absolute Long Gauge Block Measurement (AO)

Related Conference Papers

• Nonlinear effects on the carrier-envelope phase
• Vibration insensitive interferometric optical testing
• Improved optical metrology using phase retrieval
• Pixelated Mask Spatial Carrier Phase Shifting Interferometry: Algorithms and Associated Errors
• Characterization of High-Frequency Surface Modulation Using the Transport-of-Intensity Equation