We describe a birefringence measurement bench that allows fast two-dimensional measurements of low-birefringence fields in large transparent samples. We present calculations that show that, even when a birefringence bench exhibits defects (nonideal components, misalignments, etc.), measurements can be performed under realistic conditions without any a priori knowledge of the origin of the bench defects. This allows the measurement of birefringence fields on large-scale samples by use of an array of detectors instead of a single detector element, with a sensitivity of 3 × 10-4 rad for 2-s data integration.
© 2000 Optical Society of America
Original Manuscript: January 6, 2000
Revised Manuscript: April 4, 2000
Published: August 1, 2000
Géraud de Villèle and Vincent Loriette, "Birefringence imaging with imperfect benches: application to large-scale birefringence measurements," Appl. Opt. 39, 3864-3874 (2000)