We derive a set of concise formulas to characterize the temperature sensitivity of holographic wavelength-division multiplexers–demultiplexers (H-MUX’s–H-DMUX’s). The normalized parameters such as dispersion abilities, central wavelength shift rate, and variations of insertion loss hold for general grating-based wavelength-division multiplexing–demultiplexing (WDM–WDDM) structures. The results are applicable to both wide-WDM–WDDM and dense ones working in 800-, 1300-, and 1550-nm optical wavelength windows, regardless of whether their input–output ports are single-mode or multimode fibers. Detailed analysis and experiments are carried out on a fully packaged four-channel H-MUX–H-DMUX. The experimental results at temperatures from 25 to 80 °C fit nicely with the theoretical prediction. We conclude that passive grating-based H-MUX’s–H-DMUX’s are promising for meeting the requirements on temperature sensitivity in optical data communications and telecommunications. Most of the analysis can be applied to other types of Bragg-grating-based WDM–WDDM.

© 2000 Optical Society of America

[Optical Society of America ]

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