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Applied Optics

Applied Optics


  • Vol. 39, Iss. 25 — Sep. 1, 2000
  • pp: 4529–4534

Simple method for improving the sampling in profile measurements by use of the Ronchi test

Josep Arasa, Santiago Royo, and Núria Tomàs  »View Author Affiliations

Applied Optics, Vol. 39, Issue 25, pp. 4529-4534 (2000)

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We present a simple method for increasing the number of data points obtained during performance of profilometric measurements with the Ronchi test. The method is based on multiple ronchigram acquisitions that are superimposed after a few very simple data-processing operations. The measurement method, experimental setup, and data processing are described in detail from the ronchigram to the measured profile, and experimental results for a concave surface of an spherical ophthalmic lens are provided. The radius of curvature values measured for that surface are compared with the ones obtained with a high-precision radioscope, showing very good agreement and demonstrating the capability of the technique to measure topographic profiles of reflective samples.

© 2000 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Original Manuscript: January 3, 2000
Revised Manuscript: June 5, 2000
Published: September 1, 2000

Josep Arasa, Santiago Royo, and Núria Tomàs, "Simple method for improving the sampling in profile measurements by use of the Ronchi test," Appl. Opt. 39, 4529-4534 (2000)

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