Continuous-Wave Z-Scan Measurement of Photorefractive SBN:60
Applied Optics, Vol. 39, Issue 29, pp. 5360-5366 (2000)
http://dx.doi.org/10.1364/AO.39.005360
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Abstract
A cw-probe Z-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-detector data-acquisition system was used to account for temporal changes in the laser. The effects of various beam parameters such as intensity, polarization, and wavelength were studied. A theoretical simulation of the Z scan based on a band-transport model of photorefractive-index variation was also developed. This model provides reasonable agreement with the experimental results.
© 2000 Optical Society of America
OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(160.5320) Materials : Photorefractive materials
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.5330) Nonlinear optics : Photorefractive optics
(190.7070) Nonlinear optics : Two-wave mixing
Citation
Azad Siahmakoun, Detlef Breitling, and Reza A. Najaf-Zadeh, "Continuous-Wave Z-Scan Measurement of Photorefractive SBN:60," Appl. Opt. 39, 5360-5366 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-29-5360
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