Optical Technique for the Automatic Detection and Measurement of Surface Defects on Thin Metallic Wires
Applied Optics, Vol. 39, Issue 4, pp. 539-545 (2000)
http://dx.doi.org/10.1364/AO.39.000539
Acrobat PDF (2790 KB)
Abstract
In industrial applications of thin metallic wires it is important to characterize the surface defects of the wires. We present an optical technique for the automatic detection of surface defects on thin metallic wires (diameters, 50–2000 μm) that can be used in on-line systems for surface quality control. This technique is based on the intensity variations on the scattered cone generated when the wire is illuminated with a beam at oblique incidence. Our results are compared with those obtained by atomic-force microscopy and scanning-electron microscopy.
© 2000 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(240.0240) Optics at surfaces : Optics at surfaces
(240.5770) Optics at surfaces : Roughness
(240.6700) Optics at surfaces : Surfaces
Citation
Luis Miguel Sanchez-Brea, Philip Siegmann, Maria Aurora Rebollo, and Eusebio Bernabeu, "Optical Technique for the Automatic Detection and Measurement of Surface Defects on Thin Metallic Wires," Appl. Opt. 39, 539-545 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-4-539
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Topograph for Inspection of Engine Cylinder Walls (AO)
- Optical Roughness Measurements with Fringe Projection (AO)
- Diffraction of cylinders with longitudinal surface structures (JOSAA)
- Reflection of light at structured chiral interfaces (JOSAA)
- Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks (OE)
Related Conference Papers
- Light scattering in optical multilayers: review and progress
- Light scattering characterization of superpolished transparent substrates
- Angular phase measurements of polarized scattering from arbitrary surfaces and bulks
- Polarization-Vortex Focal Fields: Edge and Surface Interactions
- Characterization of Surface and Thin-Film Roughness Using PSD Functions
« Previous Article | Next Article »
OSA is a member of 