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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 6 — Feb. 20, 2000
  • pp: 962–965

Flight qualification of a diode laser for path difference determination of a high-resolution Fourier transform spectrometer

Giovanni Bianchini, Michela Lanfranchi, and Ugo Cortesi  »View Author Affiliations


Applied Optics, Vol. 39, Issue 6, pp. 962-965 (2000)
http://dx.doi.org/10.1364/AO.39.000962


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Abstract

Diode lasers offer a lightweight, rugged, and economic alternative to other types of laser source, but they often do not provide long-term stability and spectral purity of emission. We have developed a stabilized, near-infrared diode laser source that is capable of as much as 20 mW of single-mode output power for the effective replacement of a He–Ne laser in the path difference measuring system of a high-resolution (1.25-m maximum path difference) Fourier transform spectrometer. Laser characterization has been performed both in laboratory measurements and in flight tests, resulting in a relative frequency stability of better than 10-6 on a 6-h flight.

© 2000 Optical Society of America

OCIS Codes
(140.2020) Lasers and laser optics : Diode lasers
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

History
Original Manuscript: May 18, 1999
Revised Manuscript: November 29, 1999
Published: February 20, 2000

Citation
Giovanni Bianchini, Michela Lanfranchi, and Ugo Cortesi, "Flight qualification of a diode laser for path difference determination of a high-resolution Fourier transform spectrometer," Appl. Opt. 39, 962-965 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-6-962


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