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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 7 — Mar. 1, 2000
  • pp: 1164–1167

Pockels cell voltage probe for noninvasive electron-beam measurements

Michael A. Brubaker and Christopher P. Yakymyshyn  »View Author Affiliations


Applied Optics, Vol. 39, Issue 7, pp. 1164-1167 (2000)
http://dx.doi.org/10.1364/AO.39.001164


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Abstract

Accurate measurements of beam position and current are critical for the operation of the high-energy electron accelerators used for radiographic applications. Traditional short-pulse (e.g., 70 ns) machines utilize B-dot loops to monitor these parameters with great success. For long-pulse (e.g., 2 µs) accelerators, beam position and current measurements become more challenging and may require new technology. A novel electro-optic voltage probe has been developed for this application and provides the advantages of complete galvanic isolation, excellent low-frequency performance, and no time integration requirement. The design of a prototype sensor is presented along with preliminary accelerator test data.

© 2000 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(130.6010) Integrated optics : Sensors
(230.2090) Optical devices : Electro-optical devices

History
Original Manuscript: June 7, 1999
Revised Manuscript: October 21, 1999
Published: March 1, 2000

Citation
Michael A. Brubaker and Christopher P. Yakymyshyn, "Pockels cell voltage probe for noninvasive electron-beam measurements," Appl. Opt. 39, 1164-1167 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-7-1164

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