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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 31 — Nov. 1, 2001
  • pp: 5600–5609

Only One Fitting for Bironchigrams

Alberto Cordero-Dávila, Juan Manuel Nuũez-Alfonso, Esteban Luna-Aguilar, and Carlos Ignacio Robledo-Sánchez  »View Author Affiliations


Applied Optics, Vol. 40, Issue 31, pp. 5600-5609 (2001)
http://dx.doi.org/10.1364/AO.40.005600


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Abstract

We present an algorithm that uses a square grid in a Ronchi test. We assume that the point coordinates of this pattern (termed a bironchigram) are affected by Gaussian errors. To calculate the optical path difference, we apply only one nonlinear least-squares fit to the dot coordinates. The relevant equations are deduced, and experimental results are shown.

© 2001 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(190.0190) Nonlinear optics : Nonlinear optics

Citation
Alberto Cordero-Dávila, Juan Manuel Nuũez-Alfonso, Esteban Luna-Aguilar, and Carlos Ignacio Robledo-Sánchez, "Only One Fitting for Bironchigrams," Appl. Opt. 40, 5600-5609 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-31-5600


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References

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