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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 31 — Nov. 1, 2001
  • pp: 5748–5754

Origin of the hook effect in extrinsic photoconductors

Nancy M. Haegel, William R. Schwartz, Joseph Zinter, A. Michael White, and Jeffrey W. Beeman  »View Author Affiliations


Applied Optics, Vol. 40, Issue 31, pp. 5748-5754 (2001)
http://dx.doi.org/10.1364/AO.40.005748


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Abstract

The response of extrinsic photoconductors to a step change in incident photon flux has long been known to exhibit a sharp transient feature, particularly at higher signal levels, known as the hook effect. We demonstrate experimentally and theoretically that the hook effect can be due to reduced illumination adjacent to the injecting contact. This nonuniformity can be produced by the transverse illumination of the detector that is common for far-infrared Ge:Ga devices. The hook effect has been demonstrated to be either present or absent in the same Ge:Ga photoconductor, at comparable signal size, depending on the nature of the contact illumination. Numerical finite-difference calculations of the transient response support this explanation and produce features that replicate the experimental results.

© 2001 Optical Society of America

OCIS Codes
(040.0040) Detectors : Detectors
(040.3060) Detectors : Infrared
(040.5150) Detectors : Photoconductivity
(040.5160) Detectors : Photodetectors
(160.5140) Materials : Photoconductive materials
(160.6000) Materials : Semiconductor materials

History
Original Manuscript: March 28, 2001
Revised Manuscript: July 17, 2001
Published: November 1, 2001

Citation
Nancy M. Haegel, William R. Schwartz, Joseph Zinter, A. Michael White, and Jeffrey W. Beeman, "Origin of the hook effect in extrinsic photoconductors," Appl. Opt. 40, 5748-5754 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-31-5748


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References

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