An advanced interferometer was built for surface metrology in environments with severe vibration. This instrument uses active control to compensate for effects of vibration to allow surface measurement with high-resolution phase-shifting interferometry. A digital signal processor and high-speed phase control from an electro-optic modulator allows phase measurements at 4000 Hz. These measurements are fed back into a real-time servo in the digital signal processor that provides a vibration-corrected phase ramp for the surface measurements taken at video rates. Unlike fringe locking, which compensates vibration to keep the phase constant, we show a true phase servo that allows the phase to be stabilized while it is ramped, enabling surface measurements using phase-shifting interferometry that requires multiple images with controlled phase shifts.
© 2001 Optical Society of America
[Optical Society of America ]
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(220.4830) Optical design and fabrication : Systems design
Chunyu Zhao and James H. Burge, "Vibration-Compensated Interferometer for Surface Metrology," Appl. Opt. 40, 6215-6222 (2001)