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Applied Optics

Applied Optics


  • Vol. 41, Iss. 10 — Apr. 1, 2002
  • pp: 1915–1921

Interferometric phase reconstruction by nonuniform shifting of the reference beam

Neil A. Beaudry and Tom D. Milster  »View Author Affiliations

Applied Optics, Vol. 41, Issue 10, pp. 1915-1921 (2002)

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A method for phase measurement in common-path interferometers, believed to be novel, is presented. We use the property of phase reconstruction algorithms, such as the Carré and Hariharan algorithms, that do not require uniform phase across the reference beam. Only the ratio of the phase steps must be the same at each pixel. We show phase measurement and reconstruction in a common-path interferometer by shifting either the tilt or the focus of the reference wave front. We present a theoretical explanation of phase measurement using this property. We also present results from a proof-of-principle experiment using a scatterplate interferometer, in conjunction with the tilt phase-shifting technique, to measure the reflected phase of a test optical element. Furthermore, we present a computer simulation to demonstrate the mathematical validity of this measurement technique using defocus shifting, rather than tilt shifting, in the reference wave front.

© 2002 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Original Manuscript: June 8, 2001
Revised Manuscript: October 24, 2001
Published: April 1, 2002

Neil A. Beaudry and Tom D. Milster, "Interferometric phase reconstruction by nonuniform shifting of the reference beam," Appl. Opt. 41, 1915-1921 (2002)

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  1. D. Malacara, Optical Shop Testing, 2nd ed. (Academic, Boston, Mass., 1996).
  2. J. Huang, T. Honda, N. Ohyama, J. Tsujiuchi, “Fringe scanning scatterplate interferometer using polarized light,” Opt. Commun. 68, 235–238 (1988). [CrossRef]
  3. M. B. North-Morris, J. Van Delden, J. C. Wyant, “Birefringent scatterplate phase shifting interferometer,” in 18th Congress of the International Commission for Optics, A. J. Glass, J. W. Goodman, M. Chang, A. H. Guenther, T. Asakura, eds., Proc. SPIE3749, 432–433 (1999). [CrossRef]
  4. P. Carré, “Installation et utilisation du compateur photoelectique et interferential du Bureau International des Poids et Mesures,” Metrologia 2, 13–23 (1966). [CrossRef]
  5. P. Hariharan, B. F. Oreb, T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,” Appl. Opt. 26, 2504–2505 (1987). [CrossRef] [PubMed]
  6. K. Creath, “Phase-shifting speckle interferometry,” Appl. Opt. 24, 3053–3058 (1985). [CrossRef] [PubMed]
  7. D. Ghiglia, M. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley, New York, 1998).
  8. L. Rubin, “Scatterplate interferometry,” Opt. Eng. 19, 815–824 (1980). [CrossRef]

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