OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 10 — Apr. 1, 2002
  • pp: 1998–2007

Thermal properties and crystallization dynamics of a phase-change alloy for write-once optical data storage

Gerd M. Fischer, Brian Medower, Robert Revay, and Masud Mansuripur  »View Author Affiliations


Applied Optics, Vol. 41, Issue 10, pp. 1998-2007 (2002)
http://dx.doi.org/10.1364/AO.41.001998


View Full Text Article

Enhanced HTML    Acrobat PDF (312 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Using a two-laser static tester, we measured the crystallization temperature and the thermal conductivity of a phase-change alloy thin film used in write-once–read-many media of optical data storage. The experimental technique, in general, and the calibration procedures, in particular, are described. The measurement results are used as entry points into numerical calculations that ultimately yield estimates of the material parameters. Valuable information about the dynamics of mark formation (i.e., localized crystallization) in amorphous phase-change alloy films is obtained from the observed variations of the sample reflectance under short-pulse and long-pulse recording conditions. The dependence of these reflectance variations on the laser pulse power has also been investigated.

© 2002 Optical Society of America

OCIS Codes
(210.0210) Optical data storage : Optical data storage
(210.4770) Optical data storage : Optical recording
(210.4810) Optical data storage : Optical storage-recording materials
(310.6870) Thin films : Thin films, other properties
(320.4240) Ultrafast optics : Nanosecond phenomena

History
Original Manuscript: March 27, 2001
Revised Manuscript: October 12, 2001
Published: April 1, 2002

Citation
Gerd M. Fischer, Brian Medower, Robert Revay, and Masud Mansuripur, "Thermal properties and crystallization dynamics of a phase-change alloy for write-once optical data storage," Appl. Opt. 41, 1998-2007 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-10-1998


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. J. Feinleib, “Rapid reversible light-induced crystallization of an amorphous semiconductor,” Appl. Phys. Lett. 18, 254–257 (1971). [CrossRef]
  2. R. J. von Gutfeld, P. Chaudhari, “Laser writing and erasing on chalcogenide films,” J. Appl. Phys. 43, 4688–4693 (1972). [CrossRef]
  3. M. Takenaga, N. Yamada, S. Ohara, K. Nishiuchi, M. Nagashima, T. Kashihara, S. Nakamura, T. Yamashita, “New optical erasable medium using tellurium suboxide thin film,” in Optical Storage Media, A. E. Bell, A. A. Jamberdino, eds., Proc. SPIE420, 173–177 (1983). [CrossRef]
  4. M. Terao, T. Nishida, Y. Miyauchi, S. Horigome, T. Kaku, N. Ohta, “In-Se based phase-change reversible optical recording film,” in Optical Mass Data Storage II, R. P. Freese, A. A. Jamberdino, M. R. de Haan, eds., Proc. SPIE695, 105–109 (1986). [CrossRef]
  5. T. Ohta, M. Uchida, K. Yoshioka, K. Inoue, T. Akiyama, S. Furukawa, K. Kotera, S. Nakamura, “Million cycle overwritable phase-change optical disk media,” in Optical Data Storage Topical Meeting, G. R. Knight, C. N. Kurtz, eds., Proc. SPIE1078, 27–34 (1989). [CrossRef]
  6. C. D. Eden, “Vanadium dioxide storage material,” Opt. Eng. 20, 377–378 (1981). [CrossRef]
  7. N. Akahira, T. Ohta, N. Yamada, M. Takenaga, T. Yamashita, “Sub-oxide thin films for an optical recording disk,” in Optical Disk Technology, R. A. Sprague, ed., Proc. SPIE329, 195–201 (1982). [CrossRef]
  8. M. Chen, V. Marrello, “Pulse width transfer function of tellurium-alloy disks,” in Optical Storage Media, A. E. Bell, A. A. Jamberdino, eds., Proc. SPIE420, 255–259 (1983). [CrossRef]
  9. W.-Y. Lee, “Thin Te and Te alloy films for optical data storage,” in Optical Storage Media, A. E. Bell, A. A. Jamberdino, eds., Proc. SPIE420, 265–272 (1983). [CrossRef]
  10. T. Ohta, K. Kotera, K. Kimura, N. Akahira, M. Takenaga, “New write-once media based on Te-TeO2 for optical disks,” in Optical Mass Data Storage II, R. P. Freese, A. A. Jamberdino, M. R. de Haan, eds., Proc. SPIE695, 2–9 (1986). [CrossRef]
  11. N. Yamada, M. Takao, M. Takenaga, “Te-Ge-Sn-Au phase-change recording film for optical disk,” in Optical Mass Data Storage II, R. P. Freese, A. A. Jamberdino, M. R. de Haan, eds., Proc. SPIE695, 79–85 (1986). [CrossRef]
  12. Y.-C. Hsieh, M. Mansuripur, J. Volkmer, A. Brewen, “Measurement of the thermal coefficients of nonreversible phase-change optical recording films,” Appl. Opt. 36, 866–872 (1997). [CrossRef] [PubMed]
  13. M. Mansuripur, J. K. Erwin, W. Bletscher, P. K. Khulbe, K. Sadeghi, X. Xun, A. Gupta, S. B. Mendes, “Static tester for characterization of phase-change, dye polymer, and magneto-optical media for optical data storage,” Appl. Opt. 38, 7095–7104 (1999). [CrossRef]
  14. C. Peng, M. Mansuripur, “Measurement of the thermal conductivity of erasable phase-change optical recording media,” Appl. Opt. 39, 2347–2352 (2000). [CrossRef]
  15. TEMPROFILE is a product of MM Research, Inc., Tucson, Arizona. The theoretical basis of the program is described in M. Mansuripur, G. A. N. Connell, J. W. Goodman, “Laser-induced local heating of multilayers,” Appl. Opt. 21, 1106–1114 (1982).
  16. P. K. Khulbe, T. Hurst, M. Mansuripur, “Temperature-dependence of optical constants in phase-change media,” in Optical Data Storage 2001, T. Hurst, S. Kobayashi, eds., Proc. SPIE4342, 121–123 (2002). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited