Abstract

Using a two-laser static tester, we measured the crystallization temperature and the thermal conductivity of a phase-change alloy thin film used in write-once–read-many media of optical data storage. The experimental technique, in general, and the calibration procedures, in particular, are described. The measurement results are used as entry points into numerical calculations that ultimately yield estimates of the material parameters. Valuable information about the dynamics of mark formation (i.e., localized crystallization) in amorphous phase-change alloy films is obtained from the observed variations of the sample reflectance under short-pulse and long-pulse recording conditions. The dependence of these reflectance variations on the laser pulse power has also been investigated.

© 2002 Optical Society of America

Static tester for characterization of phase-change, dye–polymer, and magneto-optical media for optical data storage

Masud Mansuripur, J. Kevin Erwin, Warren Bletscher, Pramod Khulbe, Kayvan Sadeghi, Xiaodong Xun, Anurag Gupta, and Sergio B. Mendes
Appl. Opt. 38(34) 7095-7104 (1999)

Crystallization behavior of Ge-doped eutectic Sb₇₀Te₃₀ films in optical disks

Pramod K. Khulbe, Terril Hurst, Michikazu Horie, and Masud Mansuripur
Appl. Opt. 41(29) 6220-6229 (2002)

Crystallization and amorphization studies of a Ge₂Sb_2.3Te₅ thin-film sample under pulsed laser irradiation

Pramod K. Khulbe, Xiaodong Xun, and M. Mansuripur
Appl. Opt. 39(14) 2359-2366 (2000)

Measurement of the thermal coefficients of rewritable phase-change optical recording media

Chubing Peng and Masud Mansuripur
Appl. Opt. 41(2) 361-369 (2002)

Behavior of GeSbTeBi phase-change optical recording media under subnanosecond pulsed laser irradiation

Kazuo Watabe, Pavel Polynkin, and Masud Mansuripur
Appl. Opt. 43(20) 4033-4040 (2004)