Abstract

Index-determination methods based on reflectance and transmittance measurements are developed for both opaque and semitransparent metallic films. Results are given concerning chromium and nickel layers manufactured by electron-beam deposition. To take account of the evolution of the optical constants versus layer thickness, an inhomogeneous layer model is used, which permits us to obtain a good agreement between measurements and calculations. Results are applied to the design and manufacture of light absorbers for which accurate index knowledge is required. Measured absorption is higher than 0.999 on both broadband and monochromatic components.

© 2002 Optical Society of America

Thermal emissivity of semitransparent and opaque films of cholesteric liquid crystal

Nobuya Tamura and Seiji Takata
Appl. Opt. 17(19) 3051-3053 (1978)

Expressions for determination of layer absorbances of a weakly absorbing double-layer sample through reflectance at the Brewster angles

Ritta Z. Vitlina and Gregory I. Surdutovich
Appl. Opt. 41(16) 3111-3117 (2002)

Analytical achromatic design of metal–dielectric absorbers

Frédéric Lemarquis and Gérard Marchand
Appl. Opt. 38(22) 4876-4884 (1999)

Reflectance of Semitransparent Platinum Films on Various Substrates in the Vacuum Ultraviolet

G. Hass, J. B. Ramsey, and W. R. Hunter
Appl. Opt. 8(11) 2255-2259 (1969)

Triangular coordinate graphical presentation of the optical performance of a semitransparent metal film

Joseph H. Apfel
Appl. Opt. 29(28) 4272-4275 (1990)