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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 16 — Jun. 1, 2002
  • pp: 3277–3284

Toward tunable thin-film filters for wavelength division multiplexing applications

Michel Lequime, Remy Parmentier, Fabien Lemarchand, and Claude Amra  »View Author Affiliations


Applied Optics, Vol. 41, Issue 16, pp. 3277-3284 (2002)
http://dx.doi.org/10.1364/AO.41.003277


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Abstract

We provide a detailed analysis of the various problems connected with the development of tunable thin-film filters for wavelength-division multiplexing applications. We examine the relation between the change in layer thickness and the central wavelength shift for various configurations and point out the significance of the structure of the reflectors, the spacer thickness, and the location of the active layers. We describe and compare practical arrangements using either temperature or an electric field as the driving parameter.

© 2002 Optical Society of America

OCIS Codes
(160.4670) Materials : Optical materials
(230.4170) Optical devices : Multilayers
(310.3840) Thin films : Materials and process characterization
(310.6870) Thin films : Thin films, other properties

History
Original Manuscript: October 1, 2001
Published: June 1, 2002

Citation
Michel Lequime, Remy Parmentier, Fabien Lemarchand, and Claude Amra, "Toward tunable thin-film filters for wavelength division multiplexing applications," Appl. Opt. 41, 3277-3284 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3277

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