Closed-Loop Phase Stepping in a Calibrated Fiber-Optic Fringe Projector for Shape Measurement
Applied Optics, Vol. 41, Issue 16, pp. 3348-3354 (2002)
http://dx.doi.org/10.1364/AO.41.003348
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Abstract
Active homodyne feedback control can be used to stabilize an interferometer against unwanted phase drifts introduced by, for example, temperature gradients. The technique is commonly used in fiber-optic sensors to maintain the fiber at its most sensitive (quadrature) position. We describe an extension of the technique to introduce stabilized, π/2-rad phase steps in a full-field interferometer. The technique was implemented in a single-mode, fiber-optic interference fringe projector used for shape measurement and can be easily applied to other fiber- or bulk-optic interferometers, for example, speckle pattern and holographic interferometers. Fresnel reflections from the distal fiber ends undergo a double pass in the fibers and interfere at the fourth port of a directional coupler. The interference intensity (and hence phase) is maintained at quadrature by feedback control to a phase modulator in one of the fiber arms. Stepping between quadrature positions (separated by π rad for light undergoing a double pass) introduces stabilized phase steps in the projected fringes (separated by π/2 rad for a single pass). A root-mean-square phase stability of 0.61 mrad in a 50-Hz bandwidth and phase step accuracy of 1.17 mrad were measured.
© 2002 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2920) Instrumentation, measurement, and metrology : Homodyning
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
Citation
Andrew J. Moore, Roy McBride, James S. Barton, and Julian D. C. Jones, "Closed-Loop Phase Stepping in a Calibrated Fiber-Optic Fringe Projector for Shape Measurement," Appl. Opt. 41, 3348-3354 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-16-3348
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