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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 24 — Aug. 20, 2002
  • pp: 5167–5171

Cavity ringdown spectroscopy of thin films in the mid-infrared

George A. Marcus and H. Alan Schwettman  »View Author Affiliations


Applied Optics, Vol. 41, Issue 24, pp. 5167-5171 (2002)
http://dx.doi.org/10.1364/AO.41.005167


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Abstract

To demonstrate the potential of the cavity ringdown technique in mid-infrared spectroscopy of thin film samples, we measured absorption losses in a C60 film on a BaF2 substrate using a tunable optical parametric amplifier source. With a Brewster angle sample geometry, we achieved a fractional loss sensitivity as small as 1.3 × 10-7 with 1.5 cm-1 resolution, an improvement in sensitivity of 2 orders of magnitude compared to standard Fourier transform infrared methods. At an absorption sensitivity of 5 × 10-7, spectra of several C60 overtone lines were recorded.

© 2002 Optical Society of America

OCIS Codes
(300.1030) Spectroscopy : Absorption
(300.6250) Spectroscopy : Spectroscopy, condensed matter
(300.6340) Spectroscopy : Spectroscopy, infrared

History
Original Manuscript: January 21, 2002
Revised Manuscript: June 7, 2002
Published: August 20, 2002

Citation
George A. Marcus and H. Alan Schwettman, "Cavity ringdown spectroscopy of thin films in the mid-infrared," Appl. Opt. 41, 5167-5171 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-24-5167

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