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Applied Optics

Applied Optics


  • Vol. 41, Iss. 24 — Aug. 20, 2002
  • pp: 5179–5184

Photothermal deflection studies of GaAs epitaxial layers

Nibu A. George, C. P. G. Vallabhan, V. P. N. Nampoori, and P. Radhakrishnan  »View Author Affiliations

Applied Optics, Vol. 41, Issue 24, pp. 5179-5184 (2002)

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Photothermal beam deflection studies were carried out with GaAs epitaxial double layers grown on semi-insulating GaAs substrates. The impurity densities in thin epitaxial layers were found to influence the effective thermal diffusivity of the entire structure.

© 2002 Optical Society of America

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(160.6000) Materials : Semiconductor materials
(300.6430) Spectroscopy : Spectroscopy, photothermal
(310.6870) Thin films : Thin films, other properties

Original Manuscript: December 5, 2001
Revised Manuscript: March 27, 2002
Published: August 20, 2002

Nibu A. George, C. P. G. Vallabhan, V. P. N. Nampoori, and P. Radhakrishnan, "Photothermal deflection studies of GaAs epitaxial layers," Appl. Opt. 41, 5179-5184 (2002)

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  1. D. O. Thompson, D. E. Chimenti, eds., Review of Progress in Quantitative Nondestructive Evaluation (Plenum, New York, 1985), Vol. 4B. [CrossRef]
  2. C. Wang, A. Mandelis, “Purely thermal-wave photopyroelectric interferometry,” J. Appl. Phys. 85, 8366–8377 (1999). [CrossRef]
  3. C. Christofides, F. Diakonos, A. Seas, C. Christou, M. Nestoros, A. Mandelis, “Two-layer model for photomodulated thermoreflectance of semiconductor wafers,” J. Appl. Phys. 80, 1713–1725 (1996). [CrossRef]
  4. R. E. Wagner, A. Mandelis, “Nonlinear photothermal modulated optical reflectance and photocurrent phenomena in crystalline semiconductors: theoretical,” Semicond. Sci. Technol. 11, 289–299 (1996). [CrossRef]
  5. A. Mandelis, Ed., Photoacoustic and Thermal Wave Phenomena in Semiconductors (North-Holland, New York, 1987).
  6. J. A. Sell, Photothermal Investigations of Solids and Fluids (Academic, Boston, Mass., 1989).
  7. P. Hess, J. Pelzl, eds., Photoacoustic and Photothermal Phenomena (Springer-Verlag, Berlin, 1988). [CrossRef]
  8. A. C. Boccara, D. Fournier, J. Badoz, “Thermo-optical spectroscopy: detection by the ‘mirage effect,’” Appl. Phys. Lett. 36, 130–132 (1980). [CrossRef]
  9. W. B. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, “Photothermal deflection spectroscopy and detection,” Appl. Opt. 20, 1333–1344 (1981). [CrossRef] [PubMed]
  10. L. C. Aamodt, J. C. Murphy, “Photothermal measurements using a localized excitation source,” J. Appl. Phys. 52, 4903–4914 (1981). [CrossRef]
  11. K. R. Grice, L. J. Inglehart, L. O. Favro, P. K. Kuo, R. L. Thomas, “Thermal wave imaging of closed cracks in opaque solids,” J. Appl. Phys. 54, 6245–6255 (1983). [CrossRef]
  12. P. K. Kuo, M. J. Lin, C. B. Reyes, L. D. Favro, R. L. Thomas, D. S. Kim, S. Zhang, L. J. Inglehart, D. Fournier, A. C. Boccara, N. Yacoubi, “Mirage effect measurement of thermal diffusivity. I. Experimental,” Can. J. Phys. 64, 1165–1167 (1986). [CrossRef]
  13. M. Bertolotti, R. L. Voti, G. Liakhou, C. Sibilia, “On the photodeflection method applied to low thermal-diffusivity measurements,” Rev. Sci. Instrum. 64, 1576–1583 (1993). [CrossRef]
  14. D. Bicanic, ed., Proceedings of Seventh International Topical Meeting on Photoacoustic and Photothermal Phenomena (Springer, Berlin, Germany, 1992). [CrossRef]
  15. M. Bertolotti, G. L. Liakhou, R. L. Voti, S. Paolini, C. Sibilia, “Analysis of the photothermal deflection technique in the surface reflection scheme: theory and experiment,” J. Appl. Phys. 83, 966–982 (1998). [CrossRef]
  16. A. Mandelis, B. S. H. Royce, “Fundamental-mode laser-beam propagation in optically inhomogeneous electrochemical media with chemical species concentration gradients,” Appl. Opt. 23, 2892–2901 (1984). [CrossRef] [PubMed]
  17. A. Salazar, A. S. Lavega, “Thermal-diffusivity measurements using linear relations from photothermal wave experiments,” Rev. Sci. Instrum. 65, 2896–2900 (1994). [CrossRef]
  18. A. Salazar, A. S. Lavega, J. Fernandez, “Thermal-diffusivity measurements in solids by the mirage technique—experimental results,” J. Appl. Phys. 69, 1216–1223 (1991). [CrossRef]
  19. S. E. Bialkowski, Photothermal Spectroscopy Method for Chemical Analysis (Wiley, New York, 1996).
  20. G. Chen, C. L. Tien, X. Wu, J. S. Smith, “Thermal-diffusivity measurement of GaAs/AlGaAs thin-film structures,” J. Heat. Transfer 116, 325–331 (1994). [CrossRef]
  21. M. E. Levinshtein, S. L. Rumyantsev, M. Shur, eds., Handbook Series on Semiconductor Parameters (World Scientific, London, 1996).
  22. S. Adachi, Physical Properties of III–V Semiconductor Compounds (Wiley, New York, 1992). [CrossRef]
  23. A. Dargys, J. Kundroats, Handbook on Physical Properties of Ge, Si, GaAs, and InP (Science and Encyclopedia Publishers, Vilnius, Lithuania, 1994).
  24. M. Soltanolkotabi, G. L. Bennis, R. Gupta, “Temperature dependence of the thermal diffusivity of GaAs in the 100–305 K range measured by the pulsed photothermal displacement technique,” J. Appl. Phys. 85, 794–798 (1999). [CrossRef]
  25. C. M. Bhandari, D. M. Rowe, Thermal Conduction in Semiconductors (Wiley, New York, 1988).
  26. A. C. Willardson, C. Beer, eds., Semiconductors and Semimetals (Academic, New York, 1988).
  27. D. Fournier, C. Boccara, A. Skumanich, N. M. Amer, “Photothermal investigation of transport in semiconductors: theory and experiment,” J. Appl. Phys. 59, 787–795 (1986). [CrossRef]
  28. Y. S. Ju, K. E. Goodson, “Phonon scattering in silicon films with thickness of order 100 nm,” Appl. Phys. Lett. 74, 3005–3007 (1999). [CrossRef]
  29. G. Chen, “Phonon wave heat conduction in thin films and superlattices,” J. Heat Transfer 121, 945–953 (1999). [CrossRef]
  30. T. F. Zeng, G. Chen, “Phonon heat conduction in thin films: impacts of thermal boundary resistance and internal heat generation,” J. Heat Transfer 123, 340–347 (2001). [CrossRef]
  31. M. Asheghi, Y. K. Leung, S. S. Wong, K. E. Goodson, “Phonon-boundary scattering in thin silicon layers,” Appl. Phys. Lett. 71, 1798–1800 (1997). [CrossRef]

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