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Applied Optics

Applied Optics


  • Vol. 41, Iss. 28 — Oct. 1, 2002
  • pp: 5857–5859

Long-trace profiler with cyclic optical configuration

Sanjib Chatterjee and Y. Pawan Kumar  »View Author Affiliations

Applied Optics, Vol. 41, Issue 28, pp. 5857-5859 (2002)

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The results of the development of a much simpler optical configuration for the long-trace profiler (LTP) are presented. The current technique employs a cyclic optical configuration to achieve zero optical path difference for the closely spaced, laterally separated laser beams. The accuracy of measurement is found to remain as good as that in the case of the widely used LTP, although the geometrical alignment problem is simplified significantly.

© 2002 Optical Society of America

OCIS Codes
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(230.5480) Optical devices : Prisms
(340.6720) X-ray optics : Synchrotron radiation
(340.7470) X-ray optics : X-ray mirrors

Original Manuscript: June 3, 2002
Published: October 1, 2002

Sanjib Chatterjee and Y. Pawan Kumar, "Long-trace profiler with cyclic optical configuration," Appl. Opt. 41, 5857-5859 (2002)

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