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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 34 — Dec. 2, 2002
  • pp: 7254–7263

Phase measurement in temporal speckle pattern interferometry: comparison between the phase-shifting and the Fourier transform methods

Guillermo H. Kaufmann and Gustavo E. Galizzi  »View Author Affiliations


Applied Optics, Vol. 41, Issue 34, pp. 7254-7263 (2002)
http://dx.doi.org/10.1364/AO.41.007254


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Abstract

The measurement of dynamic displacements by use of speckle pattern interferometry and temporal phase unwrapping allows for the evaluation of large-object displacement fields without the propagation of spatial unwrapping errors. If a temporal carrier is introduced in one of the beams of the interferometer, phase data for whole-object displacement can be retrieved by use of a temporal phase-shifting method or a temporal Fourier transformation approach. We present a comparison between both methods of temporal phase measurement in terms of precision and execution speed. We performed the analysis by using computer-simulated speckle interferograms, an approach that allowed us to know precisely the original phase distribution and also to determine the spatial rms phase error as a function of the phase change introduced between two consecutive speckle interferograms. The performance of both methods to process experimental data is also illustrated by use of the results from a high-speed speckle interferometry study of a carbon fiber panel.

© 2002 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: May 14, 2002
Revised Manuscript: July 30, 2002
Published: December 1, 2002

Citation
Guillermo H. Kaufmann and Gustavo E. Galizzi, "Phase measurement in temporal speckle pattern interferometry: comparison between the phase-shifting and the Fourier transform methods," Appl. Opt. 41, 7254-7263 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-34-7254

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