Abstract
A new method for measuring simultaneously the thickness and the refractive index of a transparent plate is proposed. The method is based on a simple, variable lateral-shear, wavelength-scanning interferometer. To achieve highly accurate measurements of both refractive index n and thickness d we use several means to determine these two quantities. We finely tune a distributed-feedback diode laser light source to introduce a phase shift into the detected signal, whereas we make the sample rotate to produce variable lateral shearing. Phase shifting permits precise determination of the optical thickness, nd, whereas refractive index n is obtained from the retrieved phase of the overall interference signal for all incidence angles.
© 2003 Optical Society of America
Full Article | PDF ArticleMore Like This
Y. Pavan Kumar and Sanjib Chatterjee
Appl. Opt. 51(16) 3533-3537 (2012)
Y. Pavan Kumar and Sanjib Chatterjee
Appl. Opt. 49(33) 6552-6557 (2010)
Kenichi Hibino, Bozenko F. Oreb, and Philip S. Fairman
Appl. Opt. 42(19) 3888-3895 (2003)