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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 3910–3914

Direct Measurement of Refractive-Index Dispersion of Transparent Media by White-Light Interferometry

Matteo Galli, Franco Marabelli, and Giorgio Guizzetti  »View Author Affiliations


Applied Optics, Vol. 42, Issue 19, pp. 3910-3914 (2003)
http://dx.doi.org/10.1364/AO.42.003910


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Abstract

We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 μm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(λ) over the whole investigated spectral range is thus obtained directly to an accuracy of 10−4 without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.

© 2003 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.2030) Physical optics : Dispersion

Citation
Matteo Galli, Franco Marabelli, and Giorgio Guizzetti, "Direct Measurement of Refractive-Index Dispersion of Transparent Media by White-Light Interferometry," Appl. Opt. 42, 3910-3914 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-3910

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