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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 31 — Nov. 1, 2003
  • pp: 6360–6366

Interferometric Laser Diode Probing of Micrometer- and Nanometer-Scale Materials

Gregory W. Sherman and Curtis C. Bradley  »View Author Affiliations


Applied Optics, Vol. 42, Issue 31, pp. 6360-6366 (2003)
http://dx.doi.org/10.1364/AO.42.006360


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Abstract

We are developing a method for real-time detection, tracking, and categorization of micrometer- and nanometer-scale particles and materials using light scattered from a swept standing-wave probe. Synchronous, phase-sensitive detection of the weakly scattered optical field is exploited to provide interferometric sensitivity and improve the signal-to-noise ratio, allowing use of low-power laser diode sources and photodiode detectors. To demonstrate the technique, we probe a set of W, C, and Cu microfibers and determine diameters and refractive-index values from a detailed comparison of light-scattering data and a numerical model. We extrapolate these results and discuss the application of laser diode sources and photodiode receivers for the detection and study of nanoscale materials.

© 2003 Optical Society of America

OCIS Codes
(010.1100) Atmospheric and oceanic optics : Aerosol detection
(170.3340) Medical optics and biotechnology : Laser Doppler velocimetry
(290.3030) Scattering : Index measurements
(290.5820) Scattering : Scattering measurements
(290.5850) Scattering : Scattering, particles
(290.5880) Scattering : Scattering, rough surfaces

Citation
Gregory W. Sherman and Curtis C. Bradley, "Interferometric Laser Diode Probing of Micrometer- and Nanometer-Scale Materials," Appl. Opt. 42, 6360-6366 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-31-6360


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